14 results
A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 624-625
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- July 2010
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Scanning Transmission Ion Microscopy and Diffraction Imaging
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 604-605
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- July 2010
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Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 614-615
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- July 2010
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The Introduction and Application of a Selective Directional Capability of the Image Contrast Transfer Function in the ImageJ “SMARTeR” Package
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 598-599
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- July 2010
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Is Microanalysis Possible in He+ Ion Microscopes?
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 368-369
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- July 2010
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Challenges in Achieving High Resolution at Low Voltages in the SEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 660-661
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- July 2009
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Characteristics of Secondary Electron Images From In-lens and Conventional Everhart-Thornley Detectors - Evidence for the Energy-based Differentiation of High Resolution SE1 and Delocalized SE2 Signals
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 46-47
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- July 2009
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Choosing a Beam-Electrons,Protons, He or Ga ions?
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 648-649
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- July 2009
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A Study of Helium ion induced Secondary Electron Emission
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1192-1193
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- August 2008
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Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1190-1191
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- August 2008
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Microanalysis with a Low Energy Helium Ion Beam
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1398-1399
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- August 2007
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The Sensitivity of Moire Fringes in SEM Images to Instrumental and Environmental Artifacts
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1400-1401
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- August 2007
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Texture and Stability and the Effect of the Sample on Thin Metal Film Coatings for High Resolution and Low Voltage SEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1074-1075
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- August 2007
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Where is SEM Resolution Reality in 2006: How do we Measure it and What are the Limits?
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1452-1453
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- August 2006
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